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9 September 1999 Quasi-optical characterization of waveguides at frequencies above 100 GHz
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Proceedings Volume 3828, Terahertz Spectroscopy and Applications II; (1999) https://doi.org/10.1117/12.361058
Event: Industrial Lasers and Inspection (EUROPTO Series), 1999, Munich, Germany
Abstract
We analyze the precision of a quasi-optical null-balance bridge reflectometer in measuring waveguide characteristic impedance and attenuation using a one-port de-embedding after taking into account errors due to imperfect coupling of two fundamental Gaussian beam. In order to determine the desired precision, we present in-waveguide measurements of characteristic impedance and attenuation for a WR-8 adjustable precision short in the 75-110 GHz frequency range using a Hewlett-Packard HP 8510 vector network analyzer.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Silas Hadjiloucas, John W. Bowen, John W. Digby, J. Martyn Chamberlain, and David Paul Steenson "Quasi-optical characterization of waveguides at frequencies above 100 GHz", Proc. SPIE 3828, Terahertz Spectroscopy and Applications II, (9 September 1999); https://doi.org/10.1117/12.361058
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