9 September 1999 Quasi-optical characterization of waveguides at frequencies above 100 GHz
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Proceedings Volume 3828, Terahertz Spectroscopy and Applications II; (1999) https://doi.org/10.1117/12.361058
Event: Industrial Lasers and Inspection (EUROPTO Series), 1999, Munich, Germany
Abstract
We analyze the precision of a quasi-optical null-balance bridge reflectometer in measuring waveguide characteristic impedance and attenuation using a one-port de-embedding after taking into account errors due to imperfect coupling of two fundamental Gaussian beam. In order to determine the desired precision, we present in-waveguide measurements of characteristic impedance and attenuation for a WR-8 adjustable precision short in the 75-110 GHz frequency range using a Hewlett-Packard HP 8510 vector network analyzer.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Silas Hadjiloucas, Silas Hadjiloucas, John W. Bowen, John W. Bowen, John W. Digby, John W. Digby, J. Martyn Chamberlain, J. Martyn Chamberlain, David Paul Steenson, David Paul Steenson, "Quasi-optical characterization of waveguides at frequencies above 100 GHz", Proc. SPIE 3828, Terahertz Spectroscopy and Applications II, (9 September 1999); doi: 10.1117/12.361058; https://doi.org/10.1117/12.361058
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