9 September 1999 THz imaging in a Brewster-angle configuration: characterization of thin oxide coatings for fuel cell applications
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Proceedings Volume 3828, Terahertz Spectroscopy and Applications II; (1999) https://doi.org/10.1117/12.361053
Event: Industrial Lasers and Inspection (EUROPTO Series), 1999, Munich, Germany
Abstract
Time-resolved THz imaging for the incidence-angle dependent 3D tomographic characterization of layered structures is presented. We illustrate the capabilities of the developed system on multi-layer ceramic samples used for solid oxide fuel cells. Diverse methods for determining unknown refractive indices are discussed. The significant influence of the angle of incidence of a THz imaging system on the measured signal is demonstrated, which can be exploited especially in Brewster-angle configurations to enhance the capabilities of any THz tomography system.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Brucherseifer, M. Brucherseifer, Peter Haring Bolivar, Peter Haring Bolivar, Hans Hermann Klingenberg, Hans Hermann Klingenberg, Heinrich Kurz, Heinrich Kurz, } "THz imaging in a Brewster-angle configuration: characterization of thin oxide coatings for fuel cell applications", Proc. SPIE 3828, Terahertz Spectroscopy and Applications II, (9 September 1999); doi: 10.1117/12.361053; https://doi.org/10.1117/12.361053
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