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16 June 2000 Automated evaluation of patterned fabrics for defect detection
Manuel Filipe M. Costa, Francisco Rodrigues, Joao Guedes, Jorge Lopes
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Proceedings Volume 3831, Sixth International Conference on Education and Training in Optics and Photonics; (2000) https://doi.org/10.1117/12.388704
Event: Education and Training in Optics and Photonics (ETOP'99), 1999, Cancun, Mexico
Abstract
On the frames of the pedagogic project developed over the last four years by the first author `Learning by research', on this communication we will make a detailed presentation of one research work undertaken by the students on the classes of Image Processing of the Applied Physics undergraduate course of the Physics Department of the University of Minho.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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Manuel Filipe M. Costa, Francisco Rodrigues, Joao Guedes, and Jorge Lopes "Automated evaluation of patterned fabrics for defect detection", Proc. SPIE 3831, Sixth International Conference on Education and Training in Optics and Photonics, (16 June 2000); https://doi.org/10.1117/12.388704
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KEYWORDS
Image processing
Defect detection
Inspection
Applied physics
Edge detection
Physics
CCD cameras
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