Paper
16 November 1999 Acquiring even-striped pattern intensity in three-dimensional shape measurement system using an optical modulator
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Abstract
We have continued research on our 3D shape measurement system, using spatial projections of light variation patterns. This method is non-contact, non-invasive, and completes measurement in a short time. However, light diffusion influence on the measurable accuracy. We proposed a method using differentiation to enhance accuracy of measurement, and were successful in achieving this goal. Moreover, the measurable area was expanded. Since our method involves computational manipulation of the data obtained by the original system, it requires no additional equipment. It is a very practical and effective method.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Katsumi Tsujioka, Hideo Furuhashi, Kazuo Hatano, Shuntaro Higa, and Yoshiyuki Uchida "Acquiring even-striped pattern intensity in three-dimensional shape measurement system using an optical modulator", Proc. SPIE 3835, Three-Dimensional Imaging, Optical Metrology, and Inspection V, (16 November 1999); https://doi.org/10.1117/12.370264
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KEYWORDS
3D acquisition

Image processing

Projection systems

3D image processing

CCD cameras

Liquid crystals

3D metrology

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