16 November 1999 Acquiring even-striped pattern intensity in three-dimensional shape measurement system using an optical modulator
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Abstract
We have continued research on our 3D shape measurement system, using spatial projections of light variation patterns. This method is non-contact, non-invasive, and completes measurement in a short time. However, light diffusion influence on the measurable accuracy. We proposed a method using differentiation to enhance accuracy of measurement, and were successful in achieving this goal. Moreover, the measurable area was expanded. Since our method involves computational manipulation of the data obtained by the original system, it requires no additional equipment. It is a very practical and effective method.
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Katsumi Tsujioka, Hideo Furuhashi, Kazuo Hatano, Shuntaro Higa, Yoshiyuki Uchida, "Acquiring even-striped pattern intensity in three-dimensional shape measurement system using an optical modulator", Proc. SPIE 3835, Three-Dimensional Imaging, Optical Metrology, and Inspection V, (16 November 1999); doi: 10.1117/12.370264; https://doi.org/10.1117/12.370264
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