29 December 1999 Applications of atomic force microscopy to the study of lightguide fibers
Author Affiliations +
Proceedings Volume 3848, Optical Fiber Reliability and Testing; (1999) https://doi.org/10.1117/12.372766
Event: Photonics East '99, 1999, Boston, MA, United States
Atomic force microscopy has proven to be of great value in the study of the surface roughness of aged silica fibers. It has been shown that aging in both liquid water and water vapor results in surface roughening which correlates with and is apparently responsible for the strength degradation. In this paper, we show that the application of a new indenting/scratching/imaging tip and associated software allow this tool to be extended to the study of a new range of problems. We illustrate the usefulness of this `nanoindentation/imaging probe' in the study of indents and scratches on silica fiber surfaces which have undergone a variety of treatments as well as in study of coatings on these silica lightguide surfaces.
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Charles R. Kurkjian, Charles R. Kurkjian, Osman S. Gebizlioglu, Osman S. Gebizlioglu, Joel D. Mann, Joel D. Mann, } "Applications of atomic force microscopy to the study of lightguide fibers", Proc. SPIE 3848, Optical Fiber Reliability and Testing, (29 December 1999); doi: 10.1117/12.372766; https://doi.org/10.1117/12.372766

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