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16 March 2000 Nondestructive analysis of artifacts
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Proceedings Volume 3851, Scientific Detection of Fakery in Art II; (2000) https://doi.org/10.1117/12.379870
Event: Photonics East '99, 1999, Boston, MA, United States
Abstract
The development of non-destructive material analysis in the field of art and archaeology is described briefly and the applicability of x-ray fluorescence analysis (XRF) to artifacts is discussed. A new instrument based on energy dispersive XRF built at the Academy of Fine Arts in Vienna enables the analysis of large objects, e.g. easel paintings up to 2 X 3 without taking original sample material.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Manfred Schreiner "Nondestructive analysis of artifacts", Proc. SPIE 3851, Scientific Detection of Fakery in Art II, (16 March 2000); https://doi.org/10.1117/12.379870
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