8 September 1999 Critical factors in the laser beam characterization measurement algorithm
Author Affiliations +
Proceedings Volume 3862, 1999 International Conference on Industrial Lasers; (1999) https://doi.org/10.1117/12.361085
Event: International Symposium on Industrial Lasers, 1999, Wuhan, China
Abstract
Laser beam characterization is very important in some applications of industrial lasers. Besides many factors of the CCD measurement system and the properties of the beam power density distributions to be measured, the obtained accuracy of laser beam characterization also depends strongly on the beam parameters' calculation algorithm. In this paper a simulated beam width calculation was performed in order to determine the influence on the accuracy of laser beam width measurement of some factors of beam measurement algorithm. A mathematically simulated Gaussian and Super Gaussian beam was computer generated. Background and random noise with a Gaussian distribution were added to the mathematically generated beam. Measurements were then made based on second moment method which is a ISO definition. We change the background, noise level and the size of integration area during the simulated calculation so as to determine the influence on the accuracy of beam width measurement of these different factors. Based on the result of investigation, the critical factors and their solutions in the laser beam characterization algorithm are discussed, it is concluded that a calculation algorithm which can control the baseline drift and random noise effectively is essential to get high beam measurement accuracy.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wei Sun, Wei Sun, Guang Hui Wei, Guang Hui Wei, } "Critical factors in the laser beam characterization measurement algorithm", Proc. SPIE 3862, 1999 International Conference on Industrial Lasers, (8 September 1999); doi: 10.1117/12.361085; https://doi.org/10.1117/12.361085
PROCEEDINGS
6 PAGES


SHARE
RELATED CONTENT

A high resolution hand-held focused beam profiler
Proceedings of SPIE (May 15 2017)
Measurement of the laser beam quality using knife-edge method
Proceedings of SPIE (November 20 2009)
Key factors in accurate beam characterization application
Proceedings of SPIE (October 08 2000)
Processing application used in beam characterization
Proceedings of SPIE (October 09 2000)
Characterization of a clipped Gaussian beam
Proceedings of SPIE (April 16 1995)

Back to Top