Paper
8 September 1999 In-plane aligned YBCO tape on textured YSZ buffer layer deposited on NiCr alloy substrate by laser ablation with only O+ ion beam assistance
Xintang Huang, You-qing Wang, Qiulang Wang, Qingming Chen, Qiyang Xu, Zhongke Wang
Author Affiliations +
Proceedings Volume 3862, 1999 International Conference on Industrial Lasers; (1999) https://doi.org/10.1117/12.361114
Event: International Symposium on Industrial Lasers, 1999, Wuhan, China
Abstract
High critical current density and in-plane aligned YBa2Cu3O7-x (YBCO) films on textured yttria- stabilized zirconia (YSZ) buffer layers deposited on NiCr alloy (Hastelloy c-275) substrates by laser ablation with only O+ ion beam assistance were fabricated. The X- ray Phi-scan full width at half-maximums for YSZ (202) and YBCO (103) were 18 degree(s) and 11 degree(s) respectively. A critical current density of 7.9 X 105 A/cm2 of YBCO films was obtained at liquid nitrogen temperature and zero field. The critical temperature of the YBCO tape was 90 K.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xintang Huang, You-qing Wang, Qiulang Wang, Qingming Chen, Qiyang Xu, and Zhongke Wang "In-plane aligned YBCO tape on textured YSZ buffer layer deposited on NiCr alloy substrate by laser ablation with only O+ ion beam assistance", Proc. SPIE 3862, 1999 International Conference on Industrial Lasers, (8 September 1999); https://doi.org/10.1117/12.361114
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KEYWORDS
Ion beams

Ions

Laser ablation

Argon

Crystals

Laser crystals

Liquids

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