8 September 1999In-plane aligned YBCO tape on textured YSZ buffer layer deposited on NiCr alloy substrate by laser ablation with only O+ ion beam assistance
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High critical current density and in-plane aligned YBa2Cu3O7-x (YBCO) films on textured yttria- stabilized zirconia (YSZ) buffer layers deposited on NiCr alloy (Hastelloy c-275) substrates by laser ablation with only O+ ion beam assistance were fabricated. The X- ray Phi-scan full width at half-maximums for YSZ (202) and YBCO (103) were 18 degree(s) and 11 degree(s) respectively. A critical current density of 7.9 X 105 A/cm2 of YBCO films was obtained at liquid nitrogen temperature and zero field. The critical temperature of the YBCO tape was 90 K.
Xintang Huang,You-qing Wang,Qiulang Wang,Qingming Chen,Qiyang Xu, andZhongke Wang
"In-plane aligned YBCO tape on textured YSZ buffer layer deposited on NiCr alloy substrate by laser ablation with only O+ ion beam assistance", Proc. SPIE 3862, 1999 International Conference on Industrial Lasers, (8 September 1999); https://doi.org/10.1117/12.361114
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Xintang Huang, You-qing Wang, Qiulang Wang, Qingming Chen, Qiyang Xu, Zhongke Wang, "In-plane aligned YBCO tape on textured YSZ buffer layer deposited on NiCr alloy substrate by laser ablation with only O+ ion beam assistance," Proc. SPIE 3862, 1999 International Conference on Industrial Lasers, (8 September 1999); https://doi.org/10.1117/12.361114