8 September 1999 Preparation and structure characterization of CeO2 films on stainless steel substrates deposited by laser ablation with Ar+ ion beam assistance
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Proceedings Volume 3862, 1999 International Conference on Industrial Lasers; (1999) https://doi.org/10.1117/12.361118
Event: International Symposium on Industrial Lasers, 1999, Wuhan, China
Abstract
The CeO2 films were deposited by pulsed laser ablation on stainless steel substrates at room temperature with the Ar+ ion beam assistance. The results show that when the CeO2 films were deposited directly on the stainless steel substrates, the desired (001)-normal textured were achieved, but there was no evidence for alignment of in- plane crystal axes. Further experimental results indicate that CeO2/YSZ (Yttria-Stabilized Zirconia)/stainless steel films deposited under the same conditions are not only normal orientation to the substrate's surface but also highly in-plane textured.
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Xintang Huang, Xintang Huang, You-qing Wang, You-qing Wang, Qiulang Wang, Qiulang Wang, Qingming Chen, Qingming Chen, Qiyang Xu, Qiyang Xu, Zhongke Wang, Zhongke Wang, "Preparation and structure characterization of CeO2 films on stainless steel substrates deposited by laser ablation with Ar+ ion beam assistance", Proc. SPIE 3862, 1999 International Conference on Industrial Lasers, (8 September 1999); doi: 10.1117/12.361118; https://doi.org/10.1117/12.361118
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