Radiation testing of electro-optic devices in compliance with IEEE 1156.4

Roger A. Greenwell; David W. Pentrack; C. J. Pallach; Richard A. Tripoli; Larry A. Sadler; G. R. Waldsmith; Steven R. Terwilliger

doi:10.1117/12.373273

7 December 1999 Radiation testing of electro-optic devices in compliance with IEEE 1156.4

Roger A. Greenwell, David W. Pentrack, C. J. Pallach, Richard A. Tripoli, Larry A. Sadler, G. R. Waldsmith, Steven R. Terwilliger

Author Affiliations +

Proceedings Volume 3872, Photonics for Space and Radiation Environments; (1999) https://doi.org/10.1117/12.373273
Event: Remote Sensing, 1999, Florence, Italy

Abstract

Cumulative effects on electro-optic devices are presented based on the test results of combined temperature, vacuum and total dose gamma irradiation. The survivability criteria were established in IEEE Standard 1156.4. Testing of a PIN diode and an infrared light emitting diode, under thermal vacuum conditions to a total dose of 2 Mrads, was undertaken.

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Roger A. Greenwell, David W. Pentrack, C. J. Pallach, Richard A. Tripoli, Larry A. Sadler, G. R. Waldsmith, and Steven R. Terwilliger "Radiation testing of electro-optic devices in compliance with IEEE 1156.4", Proc. SPIE 3872, Photonics for Space and Radiation Environments, (7 December 1999); https://doi.org/10.1117/12.373273

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