7 December 1999 Radiation testing of electro-optic devices in compliance with IEEE 1156.4
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Proceedings Volume 3872, Photonics for Space and Radiation Environments; (1999); doi: 10.1117/12.373273
Event: Remote Sensing, 1999, Florence, Italy
Abstract
Cumulative effects on electro-optic devices are presented based on the test results of combined temperature, vacuum and total dose gamma irradiation. The survivability criteria were established in IEEE Standard 1156.4. Testing of a PIN diode and an infrared light emitting diode, under thermal vacuum conditions to a total dose of 2 Mrads, was undertaken.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Roger A. Greenwell, David W. Pentrack, C. J. Pallach, Richard A. Tripoli, Larry A. Sadler, G. R. Waldsmith, Steven R. Terwilliger, "Radiation testing of electro-optic devices in compliance with IEEE 1156.4", Proc. SPIE 3872, Photonics for Space and Radiation Environments, (7 December 1999); doi: 10.1117/12.373273; https://doi.org/10.1117/12.373273
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KEYWORDS
Light emitting diodes

Electro-optic testing

Microelectronics

Electro optics

Photonics

Mendelevium

Ionizing radiation

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