Reliability of 1300-nm laser diode for space applications

Eric Pailharey; Jacques Baggio; Claudine D'hose; Olivier Musse

doi:10.1117/12.373278

7 December 1999 Reliability of 1300-nm laser diode for space applications

Eric Pailharey, Jacques Baggio, Claudine D'hose, Olivier Musse

Proceedings Volume 3872, Photonics for Space and Radiation Environments; (1999) https://doi.org/10.1117/12.373278
Event: Remote Sensing, 1999, Florence, Italy

Abstract

A transmission data link has been simulated using a high speed digital signal to modulate a 1300 nm laser diode. A Nd:YAG laser was used to simulate ionizing effects induced by transient particle irradiation on the laser diode by creating carriers only in the laser cavity. With this method, calibration of ionizing effects, error amplitude and influence of operational parameters of the link (frequency, amplitude of modulation...) have been studied. Heavy ions at different energies have been used to confirm transient effects, but the perturbation duration, too short compared with the Nd:YAG, have limited observation of the transient error due to ionizing effects. Permanent damages have been observed and their origin linked with the particle.

Citation Download Citation

Eric Pailharey, Jacques Baggio, Claudine D'hose, and Olivier Musse "Reliability of 1300-nm laser diode for space applications", Proc. SPIE 3872, Photonics for Space and Radiation Environments, (7 December 1999); https://doi.org/10.1117/12.373278

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