7 February 2000 Beam-deflection study of shock wave formation during pulsed UV laser surface treatment of C60 films
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Proceedings Volume 3888, High-Power Lasers in Manufacturing; (2000) https://doi.org/10.1117/12.377011
Event: Advanced High-Power Lasers and Applications, 1999, Osaka, Japan
Abstract
Beam-deflection technique was used to monitor the surface treatment of fullerence films near the ablation threshold region. When the fullerence films were irradiated by UV excimer laser with fluence below the ablation threshold, an increase of the electrical conductivity of up to six orders of magnitude was observed. The products resulting from the laser irradiation have been investigated by Raman spectroscopy.
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Qihong Lou, Qihong Lou, } "Beam-deflection study of shock wave formation during pulsed UV laser surface treatment of C60 films", Proc. SPIE 3888, High-Power Lasers in Manufacturing, (7 February 2000); doi: 10.1117/12.377011; https://doi.org/10.1117/12.377011
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