Paper
8 October 1999 Designing online self-testing control units with guaranteed fault coverage
Serge N. Demidenko
Author Affiliations +
Proceedings Volume 3893, Design, Characterization, and Packaging for MEMS and Microelectronics; (1999) https://doi.org/10.1117/12.368456
Event: Asia Pacific Symposium on Microelectronics and MEMS, 1999, Gold Coast, Australia
Abstract
The paper discusses a general procedure for synthesis of concurrently self-checking control units providing prescribed level of fault coverage. The micro-program control is considered though the proposed approach can easily be extended to cover other control unit architectures.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Serge N. Demidenko "Designing online self-testing control units with guaranteed fault coverage", Proc. SPIE 3893, Design, Characterization, and Packaging for MEMS and Microelectronics, (8 October 1999); https://doi.org/10.1117/12.368456
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KEYWORDS
Diagnostics

Transition metals

Data compression

Logic

Binary data

Computer programming

Control systems

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