Paper
8 October 1999 Tool and method for the theremal transient evaluation of packages
Author Affiliations +
Proceedings Volume 3893, Design, Characterization, and Packaging for MEMS and Microelectronics; (1999) https://doi.org/10.1117/12.368429
Event: Asia Pacific Symposium on Microelectronics and MEMS, 1999, Gold Coast, Australia
Abstract
This paper presents a new concept for the thermal transient measurement of IC packages. The TTMK thermal transient test kit described here consists of a test chip, a dedicated software running on a PC and a special cable connecting the PC to the IC package which encapsulates the test chip. The function of the thermal transient test equipment is realized partly by the test chip itself and partly by the measuring software. The software performs both the control of the measurements and the evaluation of the results. The output of the evaluation software may be a compact model network or the structure function describing the properties of the heat conduction path. The use of the TTMK kit and the capabilities of the evaluation software are presented in this paper.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vladimir Szekely, Marta Rencz, and Bernard Courtois "Tool and method for the theremal transient evaluation of packages", Proc. SPIE 3893, Design, Characterization, and Packaging for MEMS and Microelectronics, (8 October 1999); https://doi.org/10.1117/12.368429
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Resistance

Capacitance

Sensors

Thermal modeling

Silicon

Chemical elements

Human-machine interfaces

Back to Top