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12 November 1999 Metrology for optoelectronics
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Proceedings Volume 3896, Design, Fabrication, and Characterization of Photonic Devices; (1999) https://doi.org/10.1117/12.370326
Event: International Symposium on Photonics and Applications, 1999, Singapore, Singapore
Abstract
This paper discusses measurement technology, standards, and traceability for the optoelectronics industry. Examples include the development of artifact standards, known as standard reference materials, for the calibration of instrumentation, and the calibration of laser and optical fiber power meters and detectors.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gordon W. Day "Metrology for optoelectronics", Proc. SPIE 3896, Design, Fabrication, and Characterization of Photonic Devices, (12 November 1999); https://doi.org/10.1117/12.370326
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