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11 November 1999 Nonintrusive surface inspection utilizing infrared light radiation
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Proceedings Volume 3897, Advanced Photonic Sensors and Applications; (1999) https://doi.org/10.1117/12.369370
Event: International Symposium on Photonics and Applications, 1999, Singapore, Singapore
Abstract
The need for quality control has lead to the implementation of automatic surface inspection systems, which have improved on-line monitoring of surface quality. Enamelled copper wire, cable and optical fiber are three examples where surface quality is very important. An extensive literature review conducted by the authors, has shown that with the current state of technology, there is much room for improvement in the field of non-destructive defect detection for enamelled copper wire. In this paper, the authors describe an IR light based surface inspection system which has been developed for non-destructive defect detection on cables, optical fiber and specifically on enamelled copper wire. Finally, results from extensive trials at an enamelled copper wire manufacturing company are presented and compared to a simulation, of the defect detection head.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hatim Abdul Hamid, Wojtek Wlodarski, and Frank Brennan "Nonintrusive surface inspection utilizing infrared light radiation", Proc. SPIE 3897, Advanced Photonic Sensors and Applications, (11 November 1999); https://doi.org/10.1117/12.369370
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