19 October 1999 Instrumentation for obtaining best-image surface in remote-sensing optoelectronic systems
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Proceedings Volume 3901, Photonics for Transportation; (1999) https://doi.org/10.1117/12.365929
Event: Photonics for Transportation, 1999, Prague, Czech Republic
Abstract
Instrumentation for high-precision in-flight focusing of on- board optoelectronic equipment is described. The first part of the paper gives an overview of the existing focusing techniques and describes their application for particular remote sensing task solutions. A comparison of different methods is made, the accuracy provided by each method is assessed and one of the best techniques--a contrast method-- is considered. This method is shown to provide high precision--5 micrometers or better. The second part describes a mathematical model of instrumentation using this method. It includes a diffraction modulation transfer function (MTF), an MTF related to optical system aberrations and an optical system defocusing MTF. The simulation results are shown and respective recommendations are given.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexandre I. Baklanov, Alexandre I. Baklanov, Alexander S. Zabiyakin, Alexander S. Zabiyakin, Maxim V. Klushnikov, Maxim V. Klushnikov, } "Instrumentation for obtaining best-image surface in remote-sensing optoelectronic systems", Proc. SPIE 3901, Photonics for Transportation, (19 October 1999); doi: 10.1117/12.365929; https://doi.org/10.1117/12.365929
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