3 March 2000 Thermographic profiles on optical surfaces: from insulators to metals
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Abstract
IR thermal imagin has been sued to study absorption in coated optical surface.s THis technique has demonstrated the ability to rapidly determine coating quality on thermally insulating substrates such as fused silica. The application of this technique to coatings deposited on thermal conductive substrates such as sapphire, silicon or copper is discussed. Data and the result of modeling are compared to show the limitations and potential of this technique for measurement and study of different classes of optical components.
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Rashmi S. Shah, Rashmi S. Shah, Alan F. Stewart, Alan F. Stewart, Jerry Ray Bettis, Jerry Ray Bettis, Lynn Bonsall, Lynn Bonsall, } "Thermographic profiles on optical surfaces: from insulators to metals", Proc. SPIE 3902, Laser-Induced Damage in Optical Materials: 1999, (3 March 2000); doi: 10.1117/12.379349; https://doi.org/10.1117/12.379349
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