18 November 1999 Multibeam Fizeau interferometer pattern localization
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Proceedings Volume 3904, Fourth International Conference on Correlation Optics; (1999) https://doi.org/10.1117/12.370411
Event: International Conference on Correlation Optics, 1999, Chernivsti, Ukraine
Abstract
Fizeau interferometer pattern analysis have carried out in the case of arbitrary slope beam illumination. Analysis get localization plane location and its dependence on wedge relative index of refraction and on the interferometer entrance mirror slope angle to the incident wave. The analyses fits experiment.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yuri N. Zakharov, "Multibeam Fizeau interferometer pattern localization", Proc. SPIE 3904, Fourth International Conference on Correlation Optics, (18 November 1999); doi: 10.1117/12.370411; https://doi.org/10.1117/12.370411
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