18 November 1999 Optical nanoscale investigation of surface characteristics
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Proceedings Volume 3904, Fourth International Conference on Correlation Optics; (1999) https://doi.org/10.1117/12.370429
Event: International Conference on Correlation Optics, 1999, Chernivsti, Ukraine
Abstract
In the paper some basic optical near field theoretical approaches will be explained as well as the principles of microscope set-ups. Application items as nanoscale topography with lateral superresolution, local spectroscopy of semiconductors, local fluorescence of dielectric films and achieving of higher data density of the recording medium will be also presented.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pavel Tomanek, "Optical nanoscale investigation of surface characteristics", Proc. SPIE 3904, Fourth International Conference on Correlation Optics, (18 November 1999); doi: 10.1117/12.370429; https://doi.org/10.1117/12.370429
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