In the paper some basic optical near field theoretical approaches will be explained as well as the principles of microscope set-ups. Application items as nanoscale topography with lateral superresolution, local spectroscopy of semiconductors, local fluorescence of dielectric films and achieving of higher data density of the recording medium will be also presented.
Pavel Tomanek, Pavel Tomanek,
"Optical nanoscale investigation of surface characteristics", Proc. SPIE 3904, Fourth International Conference on Correlation Optics, (18 November 1999); doi: 10.1117/12.370429; https://doi.org/10.1117/12.370429