Pulsed-laser deposition growth of SBN and correlation study of structure and optical properties

Felix E. Fernandez; Yelitza Gonzalez; Huimin Liu; Edgardo Rodriguez; Victor Rodriguez; Weiyi Jia

doi:10.1117/12.387556

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7 June 2000 Pulsed-laser deposition growth of SBN and correlation study of structure and optical properties

Felix E. Fernandez, Yelitza Gonzalez, Huimin Liu, Edgardo Rodriguez, Victor Rodriguez, Weiyi Jia

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Proceedings Volume 3933, Laser Applications in Microelectronic and Optoelectronic Manufacturing V; (2000) https://doi.org/10.1117/12.387556
Event: Symposium on High-Power Lasers and Applications, 2000, San Jose, CA, United States

Abstract

Strontium barium niobate thin films were grown by PLD and characterized as to their structure, composition, and both linear and nonlinear optical properties. Attempted composition of very nearly x equals 0.61 was achieved, as shown within experimental error of RBS and PIXE techniques. Films were deposited on MgO and fused silica substrates at a range of growth rates, while keeping other factors constant. Films with excellent texture, and oriented with the c-axis normal to the substrate surface where obtained on the MgO substrates. Films grown on fused silica showed a range of structures, from essentially amorphous to well oriented, again with c-axis normal to the substrate surface. The absorption edge of the films was determined to be substantially blue-shifted in comparison with bulk material. This effect appears to correlate with film microstructure, with more disordered films grown on glass showing the largest shifts. Degenerate four-wave-mixing techniques were used to study the nonlinear optical response of the amorphous films. A considerable enhancement, by 2 orders of magnitude, of the third order nonlinear susceptibility (Chi) ⁽³) in transverse alignment was found to occur with respect to bulk values.

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Felix E. Fernandez, Yelitza Gonzalez, Huimin Liu, Edgardo Rodriguez, Victor Rodriguez, and Weiyi Jia "Pulsed-laser deposition growth of SBN and correlation study of structure and optical properties", Proc. SPIE 3933, Laser Applications in Microelectronic and Optoelectronic Manufacturing V, (7 June 2000); https://doi.org/10.1117/12.387556

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