24 March 2000 Near-surface optical analysis of ion-exchanged glass waveguides
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Proceedings Volume 3936, Integrated Optics Devices IV; (2000) https://doi.org/10.1117/12.379941
Event: Symposium on Integrated Optoelectronics, 2000, San Jose, CA, United States
Results form our near-surface approach for inhomogeneous films are compared with those from the standard m-line technique in K+ and Ag+ ion-exchanged, graded- index waveguides. We focused our attention on the determination of the refractive index at the film-air interface, and we conclude, from fundamental reasoning as well as from experimental evidence, that the direct near- surface approach can provide higher accuracy than the usual extrapolation from the modal effective indices.
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Flavio Horowitz, Marcelo Barbalho Pereira, Stefano Pelli, Giancarlo C. Righini, "Near-surface optical analysis of ion-exchanged glass waveguides", Proc. SPIE 3936, Integrated Optics Devices IV, (24 March 2000); doi: 10.1117/12.379941; https://doi.org/10.1117/12.379941

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