Photoluminescence characterization of Er3+ -implanted silica thin films containing Si nanocrystals

Constantinos E. Chryssou; Anthony J. Kenyon; T. S. Iwayama; D. E. Hole; Christopher W. Pitt

doi:10.1117/12.382846

13 April 2000 Photoluminescence characterization of Er3+ -implanted silica thin films containing Si nanocrystals

Constantinos E. Chryssou, Anthony J. Kenyon, T. S. Iwayama, D. E. Hole, Christopher W. Pitt

Proceedings Volume 3942, Rare-Earth-Doped Materials and Devices IV; (2000) https://doi.org/10.1117/12.382846
Event: Symposium on Integrated Optoelectronics, 2000, San Jose, CA, United States

Abstract

Si nanocrystals (nc-Si) embedded in silica have recently attracted a lot of attention as a potential optoelectronic material due to their light emission at approximately 1.7 eV. Er³⁺ is attractive because its 1.53 micrometers emission coincides with the low attenuation region of silica optical fibers. In this paper, we report the experimental investigation of energy transfer between nc-Si and Er³⁺ in ion implanted material which may relax requirements on the Er³⁺ pump source and lead to broad-band pumped optical devices.

Citation Download Citation

Constantinos E. Chryssou, Anthony J. Kenyon, T. S. Iwayama, D. E. Hole, and Christopher W. Pitt "Photoluminescence characterization of Er3+ -implanted silica thin films containing Si nanocrystals", Proc. SPIE 3942, Rare-Earth-Doped Materials and Devices IV, (13 April 2000); https://doi.org/10.1117/12.382846

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