PROCEEDINGS VOLUME 3945
SYMPOSIUM ON INTEGRATED OPTOELECTRONICS | 20-26 JANUARY 2000
Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V
Editor(s): Geoffrey T. Burnham, Xiaoguang He, Kurt J. Linden, S. C. Wang, S. C. Wang, Geoffrey T. Burnham
Editor Affiliations +
SYMPOSIUM ON INTEGRATED OPTOELECTRONICS
20-26 January 2000
San Jose, CA, United States
High-Power and High-Brightness Diode Lasers
Takashi Komesu, Carlo Waldfried, Hae-kyung Jeong, David P. Pappas, T. Rammer, Marty E. Johnston, Tim J. Gay, Peter A. Dowben
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380522
Hans-Georg Treusch, Jim Harrison, Robert Morris, Jeff J. Powers, Dennis Brown, Joey Martin
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380541
Rajminder Singh, Aland K. Chin, Qinxin Zu, Ferdynand P. Dabkowski, Richard A. Jollay, Douglas L. Bull, Joseph Fanelli, Douglas S. Goodman, Jeffrey William Roblee, et al.
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380550
Friedhelm Dorsch, Veit Bluemel, Matthias Schroeder, Dirk Lorenzen, Petra Hennig, Detlev Wolff
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380554
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380555
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380556
Vladimir Solodovnikov, Victor Zhilin, Michael A. Lebedev
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380557
Beam Forming and Displays
Jeremiah D. Brown, Daniel M. Brown, Gregg T. Borek
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380523
Kyung-Chan Kim, Jong-Ahn Kim, SeBaek Oh, Soo Hyun Kim, Yoon Keun Kwak
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380524
Analytical Measurements and Spectroscopy
Colleen M. Fitzgerald, Grady J. Koch, Audra Michelle Bullock, Amin N. Dharamsi
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380525
Hans P. Zappe, Fabrice Monti di Sopra, Hans-Peter Gauggel, Karlheinz H. Gulden, Rainer Hovel, Michael Moser
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380526
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380527
Suat Topcu, Jean-Pierre Wallerand, Yasser Alayli, Patrick Juncar
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380528
Audra Michelle Bullock, James M. Barrington, Colleen M. Fitzgerald, Brian Seavey, Amin N. Dharamsi
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380529
SungHo Kim, Sung Man Nam, Gill Sang Byun, Shin-Young Yun, Jong Shin Yoo, Seongsik Hong
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380530
Sensing and Measurement
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380531
Horacio Lamela, Jose I. Santos
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380532
Van Hoi Pham, Duc Thinh Vu, Huu An Phung, Cao Dzung Hoang, Huy Bui, Thi Cham Tran
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380533
Prabhat Verma, Martin Herms, Gert Irmer, Masayoshi Yamada, Hiroshi Okamoto, Kunishige Oe
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380534
Rodney D. Smith II, David L. Olson, Tom Wildeman, David K. Benson
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380535
Testing and Packaging I
Niloy K. Dutta, C. Wu, Honglei Fan
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380536
Maobin Yi, Baijun Zhang, Daming Zhang, Wei Sun, Xiaojian Tian
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380537
Takashi Sato, Takayuki Nakagawa, Akinori Nishiie, Yasuaki Ohsawa, Masashi Ohkawa, Takeo Maruyama, Minoru Shimba
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380539
Testing and Packaging II
Tariq Manzur, Steven P. Bastien
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380540
Jose Q. Chan, Erik P. Zucker, TehHua Ju, Jules S. Osinski, Matthew G. Peters, Edmund L. Wolak
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380542
Francois Boubal, Sylvie Delepine, Paul Salet, Franck Gerard, David Cornec, Michel Di Maggio, Michel Goix, Jean-Pierre Chardon, Emmanuel Grard
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380543
Juergen Jandeleit, Nicolas Wiedmann, Andreas Ostlender, Wolfgang Brandenburg, Peter Loosen, Reinhart Poprawe
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380544
Reliability Testing
Hideyoshi Horie, Hirotaka Ohta, Yoshitaka Yamamoto, Nobuhiro Arai, Brian Kelly, Toshinari Fujimori, Hideki Gotoh, Masashi Usami, Yuichi Matsushima
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380545
Bo Lu, Erik P. Zucker, Edmund L. Wolak, Rainer G. Dohle, Daniel Zou, Steve Brickness
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380546
Goetz Erbert, Gerhard Beister, Arne Knauer, Juergen Maege, Wolfgang Pittroff, Peter Ressel, Juergen Sebastian, R. Staske, Hans Wenzel, et al.
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380547
Pilar Martin, Jean-Pierre Landesman, Esther Martin, A. Fily, Jean-Pierre Hirtz, Renato Bisaro
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380548
Sensing and Measurement
Ming Wang, Takahiko Sato, Guanming Lai, Shigenobu Shinohara
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380549
High-Power and High-Brightness Diode Lasers
Juergen Braunstein, Michael Mikulla, Rudolf Kiefer, Martin Walther, Juergen Jandeleit, Wolfgang Brandenburg, Peter Loosen, Reinhart Poprawe, Guenter Weimann
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380551
Sensing and Measurement
Krishnan Balasubramaniam, Alexander V. Parfenov, J. P. Singh
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380552
Testing and Packaging I
Hir Ming Shieh, Richard J. Fu, Ting-Chan Lu, Lih-Ren Chen
Proceedings Volume Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (2000) https://doi.org/10.1117/12.380553
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