Fiber-coupled diode laser systems up to 2-kW output power

Friedhelm Dorsch; Veit Bluemel; Matthias Schroeder; Dirk Lorenzen; Petra Hennig; Detlev Wolff

doi:10.1117/12.380554

29 March 2000 Fiber-coupled diode laser systems up to 2-kW output power

Friedhelm Dorsch, Veit Bluemel, Matthias Schroeder, Dirk Lorenzen, Petra Hennig, Detlev Wolff

Author Affiliations +

Proceedings Volume 3945, Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V; (2000) https://doi.org/10.1117/12.380554
Event: Symposium on Integrated Optoelectronics, 2000, San Jose, CA, United States

Abstract

High power diode laser bars and stacks are of great interest in industrial applications due to their high electro-optical efficiency, their small type of construction and maintenance free operation. With highly sophisticated beam shaping optics diode lasers can be used as pumping sources for solid state and fiber lasers and direct for material processing, e.g. welding, soldering and marking metals. We have developed different fiber coupled diode laser systems with output power up to greater than 2 kW cw into a spot 0 1.0 mm (power density greater than 250 kW/cm²) and systems with output power 170 W cw into a spot 0 0.38 mm (power density about 150 kW/cm²). The 2 kW system operates with a 0 1.5 mm fiber (N.A. 0.32) and consists of polarization and wavelength coupled stacks with an overall electro-optical efficiency of 23%. The smaller system operates either with a 0 0.6 mm (N.A. 0.22) or 0 0.4 mm (N.A. 0.33) fiber and consists of a single stack. Polarization and wavelength coupling will be realized in future. The overall electro-optical efficiency is about 27%.

Citation Download Citation

Friedhelm Dorsch, Veit Bluemel, Matthias Schroeder, Dirk Lorenzen, Petra Hennig, and Detlev Wolff "Fiber-coupled diode laser systems up to 2-kW output power", Proc. SPIE 3945, Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (29 March 2000); https://doi.org/10.1117/12.380554

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