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30 November 1983 Infrared Line Scanning System For Industrial Process Technical-Concept
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Proceedings Volume 0395, Advanced Infrared Sensor Technology; (1983)
Event: 1983 International Technical Conference/Europe, 1983, Geneva, Switzerland
Infrared line scan detection is a thermal mapping method particularly suitable to point out defects in non-destructive testing and for process monitoring control. Infrared systems designed for this type of application must show high performances, 24-hour self-operating as well as low cost. Thermo-electrically cooled infrared detector technology makes it possible to reach this goal. The digital signal generated by the optical scanning head is transmitted by means of optical fibers to the processing unit for industrial process control.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gilbert Gaussorgues "Infrared Line Scanning System For Industrial Process Technical-Concept", Proc. SPIE 0395, Advanced Infrared Sensor Technology, (30 November 1983);

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