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Integration of multiple range and intensity image pairs using a volumetric method to create textured 3D models
Fault detection and feature analysis in interferometric fringe patterns by the application of wavelet filters in convolution processors
Comparison between two classification methods: application to defects detection by artificial vision in industrial field
Geometrical pose and structural estimation from a single image for automatic inspection of filter components
Combined ellipsometer, reflectometer, scatterometer, and Kerr effect microscope for thin film disk characterization