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21 March 2000 Accommodating multiple illumination sources in an imaging colorimetry environment
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Abstract
Researchers at the Oak Ridge National Laboratory have been developing a method for measuring color quality in textile products using a tri-stimulus color camera system. Initial results of the Imaging Tristimulus Colorimeter (ITC) were reported during 1999. These results showed that the projection onto convex sets (POCS) approach to color estimation could be applied to complex printed patterns on textile products with high accuracy and repeatability. Image-based color sensors used for on-line measurement are not colorimetric by nature and require a non-linear transformation of the component colors based on the spectral properties of the incident illumination, imaging sensor, and the actual textile color. Our earlier work reports these results for a broad-band, smoothly varying D65 standard illuminant. To move the measurement to the on-line environment with continuously manufactured textile webs, the illumination source becomes problematic. The spectral content of these light sources varies substantially from the D65 standard illuminant and can greatly impact the measurement performance of the POCS system. Although absolute color measurements are difficult to make under different illumination, referential measurements to monitor color drift provide a useful indication of product quality. Modifications to the ITC system have been implemented to enable the study of different light sources. These results and the subsequent analysis of relative color measurements will be reported for textile products.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kenneth W. Tobin Jr., James S. Goddard Jr., Martin A. Hunt, Kathy W. Hylton, Thomas P. Karnowski, Marc L. Simpson, Roger K. Richards, and Dale A. Treece "Accommodating multiple illumination sources in an imaging colorimetry environment", Proc. SPIE 3966, Machine Vision Applications in Industrial Inspection VIII, (21 March 2000); https://doi.org/10.1117/12.380073
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