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26 October 1983 Use Of The SYSCAP 2.5 Computer Analysis Program For Advanced Optical System Design And Analysis
C. T. Kleiner
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Proceedings Volume 0399, Optical System Design, Analysis, and Production; (1983) https://doi.org/10.1117/12.935412
Event: 1983 International Technical Conference/Europe, 1983, Geneva, Switzerland
Abstract
The successful development of various electro-optical systems is highly dependent on precise electronic circuit design which must account for possible parameter drift in the various piece parts. The utilization of a comprehensive computer analysis program (SYSCAP) provides the electro-optical system designer and electro-optical management organization with a well-structured tool for a comprehensive system analysis'. As a result, the techniques described in this paper can be readily used by the electro-optical design community. An improved version of the SYSCAP computer program (version 2.5) is presented which inncludes the following new advances: (1) the introduction of a standard macro library that permits call-up of proven mathematical models for system modeling and simulation, (2) the introduction of improved semiconductor models for bipolar junction transistors and p-n junctions, (3) multifunction modeling capability to link signals with very high speed electronic circuit models, (4) high resolution computer graphics (both interactive and batch process) for display and permanent records, and (5) compatibility and interface with ad-vanced engineering work stations. This 2.5* version of the present SYSCAP 2 computer analysis program will be available for use through the Control Data Corporation world-wide Cybernet system in 1983*. This paper provides an overview of SYSCAP modeling and simulation capabilities.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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C. T. Kleiner "Use Of The SYSCAP 2.5 Computer Analysis Program For Advanced Optical System Design And Analysis", Proc. SPIE 0399, Optical System Design, Analysis, and Production, (26 October 1983); https://doi.org/10.1117/12.935412
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KEYWORDS
Electro optical modeling
Data modeling
Systems modeling
Electro optical design
Instrument modeling
Electronic circuits
Monte Carlo methods
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