Paper
21 July 2000 Carbon fiber composite photomask stage component
Author Affiliations +
Abstract
The semiconductor industry utilizes complex patterning tools to achieve the patterning of fine features. These tools require stiff, lightweight, dimensionally stable components in order to reliably pattern photomasks and wafers. Traditionally, these tools have used metals, ceramics, and low expansion glasses. However, a new class of materials, high performance composites, has demonstrated promise for replacing these materials. This paper discusses the design, manufacturing, and test of a carbon fiber composite stage component of an electron beam lithography tool.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Brian E. Catanzaro, Jack E. Dyer, and David Trost "Carbon fiber composite photomask stage component", Proc. SPIE 3997, Emerging Lithographic Technologies IV, (21 July 2000); https://doi.org/10.1117/12.390103
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KEYWORDS
Composites

Electron beam lithography

Photomasks

Semiconducting wafers

Carbon

Manufacturing

Interfaces

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