5 July 2000 First tests of the interferometer in the micro-arcsecond metrology testbed (MAM)
Author Affiliations +
The Space Interferometry Mission (SIM) relies on interferometry and metrology capable of measuring the change in the optical path difference with picometer accuracy. For the last two years we designed and built the Micro-Arcsecond Metrology Testbed, the key technology demonstration for SIM. In a parallel effort the data analysis code was written. The interferometer was first used in a modified configuration; white light and light from a HeNe-laser was emerging from a fiber, collimated and split into the two arms with their respective delay lines. The recombined light was then dispersed onto the CCD camera. The tests done using this interferometer resulted in data on the effects that influence the accurate determination of the fringe phase delay: (1) alignment effects; (2) CCD camera parameters; (3) path length stability, and (4) analysis related inaccuracies. While offsetting the interferometer from equal arm length, the OPD was dithered using PZT-actuated mirrors. The white-light fringe was captured for each step. At the same time the (HeNe) laser light was monitored with two photo detectors--one serving as an intensity monitor, the second one monitoring the interfered laser light. This technique was used to accurately measure the path length changes by analyzing the linear parts of the HeNe sinusoidal interference signal normalized by the HeNe intensity signal. This simple metrology system is designed to determine the optical path length changes to about 100 pm.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andreas C. Kuhnert, Andreas C. Kuhnert, Stuart B. Shaklan, Stuart B. Shaklan, TsePyng Janice Shen, TsePyng Janice Shen, Andrew E. Carlson, Andrew E. Carlson, Steven L. Azevedo, Steven L. Azevedo, } "First tests of the interferometer in the micro-arcsecond metrology testbed (MAM)", Proc. SPIE 4006, Interferometry in Optical Astronomy, (5 July 2000); doi: 10.1117/12.390283; https://doi.org/10.1117/12.390283

Back to Top