5 July 2000 GAIA testbench: monitoring the basic angle with micro-arcsecond accuracy
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Abstract
A test-bench simulating the GAIA metrology system has been developed by TNO-TPD. The lines-of-sight of the two telescopes in the GAIA instrument are separated by an angle (called `basic angle') of about 106 degrees. The basic angle stability should be within 10 microarcsecond rms over the satellite revolution period of 3 hours, or should be at least known with this accuracy. The basic angle is monitored by a high-precision interferometric laser metrology system.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bart Snijders, Bart Snijders, Pieter Kappelhof, Pieter Kappelhof, Ben C. Braam, Ben C. Braam, H. J. P. Vink, H. J. P. Vink, Peter Verhoeff, Peter Verhoeff, Bertrand Calvel, Bertrand Calvel, Frederic Safa, Frederic Safa, } "GAIA testbench: monitoring the basic angle with micro-arcsecond accuracy", Proc. SPIE 4006, Interferometry in Optical Astronomy, (5 July 2000); doi: 10.1117/12.390172; https://doi.org/10.1117/12.390172
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