5 July 2000 GAIA testbench: monitoring the basic angle with micro-arcsecond accuracy
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Abstract
A test-bench simulating the GAIA metrology system has been developed by TNO-TPD. The lines-of-sight of the two telescopes in the GAIA instrument are separated by an angle (called `basic angle') of about 106 degrees. The basic angle stability should be within 10 microarcsecond rms over the satellite revolution period of 3 hours, or should be at least known with this accuracy. The basic angle is monitored by a high-precision interferometric laser metrology system.
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Bart Snijders, Pieter Kappelhof, Ben C. Braam, H. J. P. Vink, Peter Verhoeff, Bertrand Calvel, Frederic Safa, "GAIA testbench: monitoring the basic angle with micro-arcsecond accuracy", Proc. SPIE 4006, Interferometry in Optical Astronomy, (5 July 2000); doi: 10.1117/12.390172; https://doi.org/10.1117/12.390172
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