Metrology for phase-referenced imaging and narrow-angle astrometry with the VLTI

Samuel A. Leveque

doi:10.1117/12.390231

5 July 2000 Metrology for phase-referenced imaging and narrow-angle astrometry with the VLTI

Samuel A. Leveque

Proceedings Volume 4006, Interferometry in Optical Astronomy; (2000) https://doi.org/10.1117/12.390231
Event: Astronomical Telescopes and Instrumentation, 2000, Munich, Germany

Abstract

The capability to perform Phased-Reference Imaging and Narrow-Angle Astrometry with the VLTI will be given by the PRIMA instrument, which is based on the simultaneous observation of two celestial objects. A highly accurate metrology system is required to monitor the optical path followed by the two objects inside the VLTI. In the framework of PRIMA, this paper reviews the requirements as well as the constraints for such a metrology system and discusses its implementation.

Citation Download Citation

Samuel A. Leveque "Metrology for phase-referenced imaging and narrow-angle astrometry with the VLTI", Proc. SPIE 4006, Interferometry in Optical Astronomy, (5 July 2000); https://doi.org/10.1117/12.390231

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available