5 July 2000 Metrology for phase-referenced imaging and narrow-angle astrometry with the VLTI
Author Affiliations +
Abstract
The capability to perform Phased-Reference Imaging and Narrow-Angle Astrometry with the VLTI will be given by the PRIMA instrument, which is based on the simultaneous observation of two celestial objects. A highly accurate metrology system is required to monitor the optical path followed by the two objects inside the VLTI. In the framework of PRIMA, this paper reviews the requirements as well as the constraints for such a metrology system and discusses its implementation.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Samuel A. Leveque, "Metrology for phase-referenced imaging and narrow-angle astrometry with the VLTI", Proc. SPIE 4006, Interferometry in Optical Astronomy, (5 July 2000); doi: 10.1117/12.390231; https://doi.org/10.1117/12.390231
PROCEEDINGS
9 PAGES


SHARE
KEYWORDS
Metrology

Interferometers

Heterodyning

Retroreflectors

Polarization

Telescopes

Interferometry

Back to Top