5 July 2000 Planar integrated optics contribution to instrumention for interferometry
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Abstract
The aim of this presentation is to expose how astronomical instrumentation for single mode interferometry can benefit from planar optics intrinsic properties. Components based on this technology, initially developed for telecommunication and micro-sensors, are routinely produced by the industry.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pierre Y. Kern, Jean-Philippe Berger, Pierre Haguenauer, Fabien Malbet, Karine Perraut-Rousselet, "Planar integrated optics contribution to instrumention for interferometry", Proc. SPIE 4006, Interferometry in Optical Astronomy, (5 July 2000); doi: 10.1117/12.390178; https://doi.org/10.1117/12.390178
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