7 July 2000 GriF: an infrared 3D spectroscopic mode for KIR/PUEO
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Abstract
When combined with Adaptive Optics, integral field spectroscopy, i.e. observation of a sky field simultaneously in a number of spectral passbands, is the most efficient way to perform spectro-imaging at high angular resolution. GriF will provide the CFHT community with such a capability in the near infrared K-band. This extension will be completed by means of two simple optical devices to be installed in the KIR cryostat (the infrared camera of PUEO): a cooled grism in the filter-wheel and a cold aperture on an entrance focal plane wheel. They will be completed by a room-temperature Fabry- Perot (FP) interferometer in front of KIR. The FP selects narrow bandpass images while the grism spatially separates them, giving a 3-D spectroscopic capacity within a compact and light design. At each exposure, several (up to 9) monochromatic images of a rectangular field of about 36 arcseconds X 4 arc-seconds will be simultaneously acquired, allowing a precise subtraction of continuum and background. The cooled grism will guarantee a low background environment, thus a good sensitivity at K. The medium spectral resolution (about 2600) will fit to a number of programs and will represent a considerable improvement on imaging with narrow- band filters. Thus, combining high angular resolution with the spectroscopic diagnosis, GriF will allow the study of a large class of compact objects or structures, especially in the extragalactic domain where its sensitivity should be unique.
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Yann Clenet, Yann Clenet, Robin Arsenault, Robin Arsenault, Jean-Luc Beuzit, Jean-Luc Beuzit, Almas Chalabaev, Almas Chalabaev, Claude Delage, Claude Delage, Gilles Joncas, Gilles Joncas, Francois Lacombe, Francois Lacombe, Olivier Lai, Olivier Lai, Etienne LeCoarer, Etienne LeCoarer, David Le Mignant, David Le Mignant, Sylvain Pau, Sylvain Pau, Patrick Rabou, Patrick Rabou, Daniel Rouan, Daniel Rouan, } "GriF: an infrared 3D spectroscopic mode for KIR/PUEO", Proc. SPIE 4007, Adaptive Optical Systems Technology, (7 July 2000); doi: 10.1117/12.390389; https://doi.org/10.1117/12.390389
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