16 August 2000 TEIFU: a high-resolution integral field unit for the William Herschel Telescope
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In order to enhance the spectroscopic capabilities of the William Herschel Telescope (WHT) we have recently completed an integral field unit comprising 1000 elements. Integral field units maximize the efficiency of a spectrograph by re- formatting a 2D field in order to match the entrance slit of the camera. Such techniques enable high-resolution spectral data to be obtained over the whole field simultaneously, and are particularly suited for use with adaptive optics systems. TEIFU is an optical fiber system employing microlens arrays for input and output coupling. The field is divided into two halves, permitting object and background to be derived during the same exposure. In addition, the fields can be optically re-positioned to form a larger, single field for greater object coverage. Thus the observer can choose between different observing modes to emphasize background subtraction or contiguous field. The fore-optics can be changed to alter the image scale and to interface to the NAOMI adaptive optics system which is currently under construction. TEIFU in its present configuration as tested on the WHT, gives a spatial sampling of 0.25 arcsec with a total field of 7.8 by 7.0 arcsec, but a 0.125 arcsec sampling option may be provided. We are also considering an option to upgrade TEIFU for near IR operation. This paper will outline system design, operation and preliminary results.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Graham J. Murray, Graham J. Murray, Jeremy R. Allington-Smith, Jeremy R. Allington-Smith, Robert Content, Robert Content, George N. Dodsworth, George N. Dodsworth, Colin N. Dunlop, Colin N. Dunlop, Roger Haynes, Roger Haynes, Ray M. Sharples, Ray M. Sharples, John Webster, John Webster, "TEIFU: a high-resolution integral field unit for the William Herschel Telescope", Proc. SPIE 4008, Optical and IR Telescope Instrumentation and Detectors, (16 August 2000); doi: 10.1117/12.395519; https://doi.org/10.1117/12.395519


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