18 July 2000 First measurements on a DEPFET active pixel matrix for x-ray imaging spectroscopy
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Abstract
A 64 X 64 pixel matrix prototype has been produced at the HLL. We will describe the test system setup and present measurements which characterize the performance.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter Klein, P. Buchholz, Peter Fischer, N. Hoernel, Peter Holl, Josef Kemmer, M. Loecker, Gerhard Lutz, W. Neeser, Diana Stoetter, Lothar Strueder, M. Trimpl, J. Ulrici, J. Vocht, Norbert Wermes, "First measurements on a DEPFET active pixel matrix for x-ray imaging spectroscopy", Proc. SPIE 4012, X-Ray Optics, Instruments, and Missions III, (18 July 2000); doi: 10.1117/12.391598; https://doi.org/10.1117/12.391598
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KEYWORDS
Field effect transistors

Sensors

Transistors

Electrons

Imaging spectroscopy

X-ray imaging

Manganese

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