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18 July 2000 Optical design for testing and aligning lightweight grazing incidence x-ray mirrors
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Test and alignment of light weight X-ray optics have been a challenge for two reasons: (1) that the intrinsic mirror quality and distortions caused by handling can not be easily separated, and (2) the diffraction limits of the visible light become a severe problem at the order of one arc- minute. Traditional methods of using a normal incident pencil or small parallel beam which monitors a tiny fraction of the mirror in question at a given time can not adequately monitor those distortions. We are developing a normal incidence setup that monitors a large fraction, if not the whole, of the mirror at any given time. It allow us to test and align thin X-ray mirrors to an accuracy of a few arc seconds or to a limit dominated by the mirror intrinsic quality.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
William W. Zhang "Optical design for testing and aligning lightweight grazing incidence x-ray mirrors", Proc. SPIE 4012, X-Ray Optics, Instruments, and Missions III, (18 July 2000);


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