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18 July 2000 Performances of the thin crystal spectrometer
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Abstract
A thin crystal with a thickness of approximately micrometers makes it possible to disperse incident x rays in a certain energy band, like a grating. We report a current performance of this new spectroscopic device. We show that Ti K (alpha) 1 and K (alpha) 2 lines are simultaneously diffracted to different directions making a two peaks. The experiment shows the energy resolving power of (E/(Delta) E > 3000) over approximately 24 eV range. A brief comparison will be presented among this thin crystal, gratings and Bragg crystals.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shunji Kitamoto, Hideki Ogata, and Takako Horikawa "Performances of the thin crystal spectrometer", Proc. SPIE 4012, X-Ray Optics, Instruments, and Missions III, (18 July 2000); https://doi.org/10.1117/12.391575
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