18 July 2000 Polarized monochromatic x-ray beam extracted from laboratory electron impact source
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Abstract
We measure the polarization degree of monochromatic X-rays from an electron impact type X-ray generator through a double crystal spectrometer. The double crystal spectrometer is installed so that it enhances the polarization from the generator by its different efficiency for (pi) and (sigma) polarized X-rays. Measurement is performed for applied high voltage (HV) of 20 kV to 50 kV, and monochromatic X-ray energy in the unit of keV (Ex) of 0.7 to 0.9 times HV. We obtain the polarization degree of 0.48 and 0.41 for HV equals 20 and HV equals 50 with Ex/HV equals 0.9. We also measure the polarization degree of direct beam without the monochrometer, comparing the polarization boosting factor by crystals measured with theoretical model. The system is good for getting moderate intensity of partially polarized monochromatic X-ray beam.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tetsuji Koike, Tetsuji Koike, Kiyoshi Hayashida, Kiyoshi Hayashida, Yasuaki Hashimoto, Yasuaki Hashimoto, Daisuke Akutsu, Daisuke Akutsu, Masayuki Ohtani, Masayuki Ohtani, Hiroshi Tsunemi, Hiroshi Tsunemi, } "Polarized monochromatic x-ray beam extracted from laboratory electron impact source", Proc. SPIE 4012, X-Ray Optics, Instruments, and Missions III, (18 July 2000); doi: 10.1117/12.391578; https://doi.org/10.1117/12.391578
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