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18 July 2000 Radiation damage in the Chandra x-ray CCDs
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Abstract
Front side illuminated CCDs comprising focal plane of Chandra X-ray telescope have suffered some radiation damage in the beginning of the mission. Measurements of CTI and dark current at different temperatures led us to conclusion that the type of damage is inconsistent with the much studied type of damage created by protons with energies higher than 10 MeV. Intensive ground based investigation showed that irradiation of CCD with low energy protons (about 100 keV) results in the device characteristics very similar to the ones of the flight chips (very low dark current, the shape of the CTI temperature dependence). We were able to reliably determine that only image section of the flight chips was damaged and therefore only fast transfer from image to frame store section was affected. We have developed several techniques in order to determine the parameters of the electron traps introduced into the transfer channel of the irradiated device.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gregory Y. Prigozhin, Steven E. Kissel, Mark W. Bautz, Catherine Grant, Beverly LaMarr, Richard F. Foster, George R. Ricker Jr., and Gordon P. Garmire "Radiation damage in the Chandra x-ray CCDs", Proc. SPIE 4012, X-Ray Optics, Instruments, and Missions III, (18 July 2000); https://doi.org/10.1117/12.391612
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