18 July 2000 X-ray imaging spectrometers for Astro-E: ground calibration in the soft x-ray range
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Abstract
Soft X-ray response of X-ray Imaging Spectrometers (XIS) for the Astro-E satellite is measured with a grating spectrometer system at Osaka. First, relation between incident X-ray energy and output pulse height peak (E-PH relation) is examined with an SX grating. It is found that jump in the E-PH relation around Si-K edge is at most 2.7 eV. Second, quantum efficiency (QE) of the XIS in 0.4 - 2.2 keV range is measured relatively to the reference CCD of which absolute QE was calibrated with a gas proportional counter. The QE is fitted with a model in which CCD gate structures are considered. Systematic error on the QE results is estimated by referring an independent measurement. Third, tuning and improvement of the response function is performed. We employ six components to reproduce the response profile of the XIS. In this paper, improvement of one component which is originated in the events absorbed in the channel-stop is presented. Nevertheless, Astro-E was lost due to the launch failure. We overview the XIS project in its flight model phase, modified points of the design, problems and solutions etc., in order to be utilized in a possible recovery of the satellite.
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Kiyoshi Hayashida, Kiyoshi Hayashida, Shunji Kitamoto, Shunji Kitamoto, Emi Miyata, Emi Miyata, Hiroshi Tsunemi, Hiroshi Tsunemi, Kumi Yoshita, Kumi Yoshita, Takayoshi Kohmura, Takayoshi Kohmura, Kouji Mori, Kouji Mori, Kazunori Katayama, Kazunori Katayama, Haruyoshi Katayama, Haruyoshi Katayama, Makoto Shouho, Makoto Shouho, Motoari Ohta, Motoari Ohta, Tadayasu Dotani, Tadayasu Dotani, Masanobu Ozaki, Masanobu Ozaki, Katsuji Koyama, Katsuji Koyama, Hisamitsu Awaki, Hisamitsu Awaki, Takeshi G. Tsuru, Takeshi G. Tsuru, George R. Ricker, George R. Ricker, Mark W. Bautz, Mark W. Bautz, Richard F. Foster, Richard F. Foster, Steven E. Kissel, Steven E. Kissel, } "X-ray imaging spectrometers for Astro-E: ground calibration in the soft x-ray range", Proc. SPIE 4012, X-Ray Optics, Instruments, and Missions III, (18 July 2000); doi: 10.1117/12.391548; https://doi.org/10.1117/12.391548
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