13 December 1999 Reproduction of emissive power (self-calibration) using an emissive diode
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Proceedings Volume 4018, Optoelectronic Metrology; (1999) https://doi.org/10.1117/12.373725
Event: Optoelectronic Metrology, 1998, Lancut, Poland
A new method of self-calibration of the emissive power of an emissive diode is presented here. The method involves a determination of the overall quantity of the thermal and emissive power released in a semiconductor-type radiating structure in the non-steady-state mode. According to a preliminary analysis it is characterized by satisfactory metrological characteristics.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
L. S. Lovinsky, L. S. Lovinsky, } "Reproduction of emissive power (self-calibration) using an emissive diode", Proc. SPIE 4018, Optoelectronic Metrology, (13 December 1999); doi: 10.1117/12.373725; https://doi.org/10.1117/12.373725

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