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13 December 1999 Solid state laser devices of optical metrology
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Proceedings Volume 4018, Optoelectronic Metrology; (1999) https://doi.org/10.1117/12.373739
Event: Optoelectronic Metrology, 1998, Lancut, Poland
Abstract
A review of solid-state lasers used in optical metrology is presented. Various sources of laser parameters instabilities are discussed. Methods of laser output parameters stabilization are proposed. The solutions for Nd:YAG, Ti:sapphire, semiconductor, glass and fiber lasers are shortly presented and discussed. Possibilities and perspectives of use of different laser systems as standards for energy, power or frequency units are also shown.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrzej Dlugaszek, Anatoliy I. Khizhnyak, Igor I. Peshko, and Wojciech Skrzeczanowski "Solid state laser devices of optical metrology", Proc. SPIE 4018, Optoelectronic Metrology, (13 December 1999); https://doi.org/10.1117/12.373739
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