12 July 2000 Innovations in IR projector arrays
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Proceedings Volume 4027, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V; (2000); doi: 10.1117/12.391704
Event: AeroSense 2000, 2000, Orlando, FL, United States
In the past year, Honeywell has developed a 512 X 512 snapshot scene projector containing pixels with very high radiance efficiency. The array can operate in both snapshot and raster mode. The array pixels have near black body characteristics, high radiance outputs, broad band performance, and high speed. IR measurements and performance of these pixels will be described. In addition, a vacuum probe station that makes it possible to select the best die for packaging and delivery based on wafer level radiance screening, has been developed and is in operation. This system, as well as other improvements, will be described. Finally, a review of the status of the present projectors and plans for future arrays is included.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Barry E. Cole, B. Higashi, Jeff A. Ridley, J. Holmen, K. Newstrom, C. Zins, K. Nguyen, Steven R. Weeres, Burgess R. Johnson, Robert G. Stockbridge, Robert Lee Murrer, Eric M. Olson, Thomas P. Bergin, James R. Kircher, David S. Flynn, "Innovations in IR projector arrays", Proc. SPIE 4027, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V, (12 July 2000); doi: 10.1117/12.391704; https://doi.org/10.1117/12.391704

Raster graphics


Semiconducting wafers

Projection systems




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