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24 July 2000 Experimental study of laser bistatic scattering from random deeply rough surface and backscattering enhancemant
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Abstract
The laser bistatic scattering from some deeply rough plane samples are measured by using of the automated scattering measurement system. We observe the backscattering enhancement, which is confined to a narrow cone around the antispecular direction, and discuss the influences of roughness and dielectric properties on them.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhensen Wu, Kun Song, and Liyan Qi "Experimental study of laser bistatic scattering from random deeply rough surface and backscattering enhancemant", Proc. SPIE 4029, Targets and Backgrounds VI: Characterization, Visualization, and the Detection Process, (24 July 2000); https://doi.org/10.1117/12.392550
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